| Chairman: |
Dr. Yuhua Cheng, Peking University, China |
| Co-Chairmen: |
Dr. Charles Chiang, Synopsys, USA |
| Committee Members: |
Dr. David Pan, University of Texas at Austin |
| Dr. Li-Fu Chang, SMIC |
| Dr. Kuen-Yu Tsai, National Taiwan University |
| Dr. Ting-Chi Wang, National Tsinghua University |
| |
March 17
|
| 13:00-13:05 |
Chairman Address |
| |
Yuhua Cheng, Peking University, China |
| 13:05-13:35 |
Invited:Implications of Intra-die Variability on Timing, Power, Reliability, and Yield for 65nm Technology and beyond |
| |
Jamil Kawa, Synopsis |
| 13:35-14:05 |
Invited:Applying 3D electromagnetic simulations to achieve accurate sub-90nm RC extraction for DFM |
| |
Keh-Jeng Chang, National Tsing Hua University |
| 14:05-14:35 |
Invited:A Complete DFM Environment for 65 nm and Below |
| |
Dwayne Burek , Magma Design Automation |
| 14:35-15:05 |
Invited:Design For Manufacturing (DFM) in Nano-CMOS Era |
| |
Yuhua Cheng, Peking University |
| 15:05-15:30 |
Coffee Break |
| 15:30-15:50 |
Sponsor Speech: Engineering Data Analysis Solution for semiconductor test |
| |
HongXing Zhao, IBM Global Services China Company Limited |
| 15:50-16:10 |
Efficient Atomistic Method Simulation on Low Energy Doping and High Temperature Annealing Technology |
| |
Min Yu, Peking University |
| 16:10-16:30 |
Impacts of Gate Line Edge Roughness on Sub 100nm MOSFETs |
| |
Yucheng Song, Peking University |
